- built-in-test design
- Микроэлектроника: проектирование с встроенным текстовым диагностированием
Универсальный англо-русский словарь. Академик.ру. 2011.
built-in-test design
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Design thinking — refers to the methods and processes for investigating ill defined problems, acquiring information, analyzing knowledge, and positing solutions in the design and planning fields. As a style of thinking, it is generally considered the ability to… … Wikipedia
Test Engineering — (TE) is generally defined as the application of one or more engineering branches (such as Electrical Engineering, Mechanical Engineering, Genetic Engineering, etc.) and/or the application of one or more pure scientific disciplines (such as… … Wikipedia
Design for testing — Design for Test (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and… … Wikipedia
Design For Test — (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply… … Wikipedia
Built-in-self-test — (BIST) bedeutet, dass ein elektronischer Baustein eine integrierte Test Schaltung besitzt, welche Testsignale erzeugt und meist auch mit vorgegebenen richtigen Antwort Signalen vergleicht, so dass ein Testresultat an das ATE (Automatic Test… … Deutsch Wikipedia
Design by contract — (DbC) or Programming by Contract is an approach to designing computer software. It prescribes that software designers should define formal, precise and verifiable interface specifications for software components, which extend the ordinary… … Wikipedia
Design management — is the business side of design. Design managers need to speak the language of the business and the language of design … Wikipedia
Built-in self-test — A built in self test (BIST)mechanism within an integrated circuit (IC) is a function that verifies all or a portion of the internal functionality of the IC. For example, a BIST mechanism is provided in advanced fieldbus systems to verify… … Wikipedia
Design of experiments — In general usage, design of experiments (DOE) or experimental design is the design of any information gathering exercises where variation is present, whether under the full control of the experimenter or not. However, in statistics, these terms… … Wikipedia
Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… … Wikipedia
Test Track — Infobox Disney ride name= Test Track caption= park= Epcot land= designer= Walt Disney Imagineering, General Motors Corporation manufacturer= type= High speed simulated test track theme= Vehicle Test Facility control system= Wayside… … Wikipedia
